Test Probe B of IEC 61032 – BONAD Jointed Test Finger
Technical Parameters:
| Feature | Description |
|---|---|
| Knurled Finger Diameter | 12 mm |
| Knurled Finger Length | 80 mm |
| Baffle Diameter | 50 mm |
| Baffle Length | 100 mm |
| Baffle Thickness | 20 mm |
Standard:
- IEC60065
- IEC60335-1
- IEC60529
- IEC60884-1
- IEC60950
- IEC61032
- IEC69745-1
Purpose:
- The knurled finger probe’s joint part for standard tests cannot touch live parts or approach hazardous parts. The baffle of 50mm to 20mm cannot enter.
- In anti-electric shock tests, it is required for wiring, power supply devices, and lighting devices.
Notes:
- Both joints should permit movement in the same plane and direction through an angle of 90° with a tolerance of 0° to +10°.
- The joint test finger is a precision stainless steel product. When using it, it should be gently lifted and lowered with attention to maintenance.
