IEC 60529 IP2X Jointed test finger probe B with 50N froce
Technical Parameters:
| Model | Item name | Standatds | Parameters | Pictures: |
| BND-B | Jointed test finger probe B without force | IEC61032
IEC60950 IEC60335 IEC60045 IEC60884 |
Knurled Finger Diameter:12mm
Knurled Finger Length:80mm Baffle Plate Diameter:50mm Baffle Plate Length:100mm Baffle Thickness:20mm |
 |
| BND-BF | Jointed test finger
probe B with force (10N,20N,30N,40N,50N) |
Knurled Finger Diameter:12mm Knurled Finger Length:80mm Baffle Plate Diameter:50mm Baffle Plate Length:100mm Baffle Thickness:20mm |
 |
Tests for protection against solid foreign objects indicated by the first characteristic numeral specified in IEC60529.
| First No. | Addit. Letter | Access Probe | test force |
| 2 | B |  |
10N±10% |
Acceptance condition:
The protection is satisfactory if adequate clearance is kept between the access probe andhazardous parts.
in the case of the test for the additional letter B, the jointed test finger may penetrate to its 80 mm length, but the stop face (Ф50 mm x 20 mm) shall not pass through the opening. Starting from the straight position, both joints of the test finger shall be successively bent through an angle of up to 90 with respect to the axis of the adjoining section of the finger and shall be placed in every possible position.
Material: metal, except where otherwise specified
Linear dimensions in millimetres
Tolerances on dimensions without specific tolerance:
on angles: 0/-10°
on linear dimensions.
up to 25 mm: 0-0.05over 25 mm: +0,2
Both joints shall permit movement in the same plane andthe same direction through an angle of 90° with a 0 to +10°tolerance.
Pictures of jointed test figner:
