Test Finger Probe with Diameter 50 mm Circular Stop Face of IEC60335 20.2 – BONAD Test Finger Probe
Standards:
Our Jointed Test Finger adheres to multiple international standards, ensuring its reliability and effectiveness in various applications. These standards include:
- IEC 61032
- IEC 60950
- IEC 60335
- IEC 60529
- IEC 60045
- IEC 60084
- IEC 60745-1
Purpose:
The primary purpose of the Jointed Test Finger with a Diameter 50 mm Circular Stop Face is to verify basic protection against contact with hazardous parts. It also ensures protection against accidental contact with fingers. The test finger probe consists of three main components:
- Finger: Simulates the human finger for accurate testing.
- Base: Provides stability during testing.
- Insulated Handle: Ensures safe handling by simulating the characteristics of a human hand.
The probe features two movable joints that can bend up to 90°, allowing it to simulate realistic human interactions and ensuring comprehensive safety evaluations.
Features:
- High Accuracy: Designed according to stringent international standards.
- Versatility: Suitable for various testing scenarios across multiple industries.
- Durability: Made from high-quality materials for long-term use.
- Ease of Use: Ergonomic design for comfortable handling and precise testing.
Technical parameters:
| Feature | Description |
|---|---|
| Knurled Finger Diameter | 12 mm |
| Knurled Finger Length | 80 mm |
| Baffle Plate Diameter | 50 mm |
| Baffle Plate Length | 100 mm |
| Baffle Thickness | 20 mm |
Applications:
The Jointed Test Finger is widely used in industries such as electronics, household appliances, and industrial machinery. It plays a crucial role in product development, quality control, and compliance testing.
