Scope and Objective
The International Standard IEC 61032 outlines the specifications and dimensions for test probes designed to ensure the safety provided by enclosures. These probes are crucial for:
- Protecting individuals from accessing hazardous parts within an enclosure.
- Safeguarding equipment inside the enclosure from the intrusion of solid foreign objects.
The primary objectives of this standard include:
- Consolidating various object and access probes specified in other standards into a single publication, along with introducing any necessary new probes.
- Guiding technical committees in selecting appropriate finger probes.
- Encouraging the use of test probes as specified in this standard, rather than modifying existing details and dimensions.
- Limiting the proliferation of different types of test probes.
General Recommendations
When selecting test probes, priority should be given to IP code probes. The use of other types of probes, particularly those not specified in this standard, should be limited to situations where IP code probes are impractical.
Note 1: The responsibility for selecting a test probe for a specific purpose lies with the relevant technical committees.
Note 2: Technical committees aiming to develop new or modify existing probes should submit their proposals to technical committee 70 for amending this standard.
The application of these probes, along with test conditions, acceptance criteria, and procedures for resolving conflicting test results, falls under the jurisdiction of the relevant product committee. Certificates based on test probes conforming to the first edition of IEC 61032 should remain valid.
Normative References
The following normative documents contain provisions that constitute part of this International Standard through reference. At the time of publication, these editions were current. All standards are subject to revision, and parties using this International Standard are encouraged to investigate applying the most recent editions:
- CEI 60050(826): 1982 – International Electrotechnical Vocabulary (IEV) – Chapter 826: Electrical Installations of Buildings.
- CEI 60529: 1989 – Degrees of Protection Provided by Enclosures (IP Code).
- CEI 60536: 1976 – Classification of Electrical and Electronic Equipment Concerning Protection Against Electric Shock.
- ISO 4287-1: 1984 – Surface Roughness – Terminology – Part 1: Surface and Its Parameters.
IEC Articulating Finger Probe with Dynamometer Specifications
This specialized finger probe is designed according to several international standards including IEC61032, IEC60335-1, IEC60529-2001, IRAM 4220-1, SASO/IEC60335-1, SASO IEC60950, and IEC60950/EN60950. The key specifications are:
- Knurled Finger Diameter: 12 mm
- Knurled Finger Length: 80 mm
- Baffle Plate Diameter: 50 mm
- Baffle Plate Length: 100 mm
- Baffle Thickness: 20 mm
- Material: Stainless Steel
- Handle Material: Nylon
- Thrust Force: 50N
This articulating finger probe is an essential tool for ensuring compliance with safety standards related to protection against hazardous parts and ingress of foreign objects.
